Atomic Force Microscope (AFM)

Description:
Atomic Force Microscope (AFM) or Scanning Probe Microscope (SPM) from Asylum Research of Oxford Instruments, i.e., Asylum Research MFP-3D-BIO. The Asylum Research MFP-3D-BIO sets the standard for integrating AFM and optical microscopy for bioscience research. It is the only Bio-AFM that makes no compromises to AFM imaging resolution, force measurement performance, or application versatility while seamlessly integrating with a full range of optical techniques.

Applications:

1. Uncompromised AFM performance integrated with optical microscopy
2. Supports numerous optical techniques such as Brightfield, Phase Contrast, Epifluorescence Microscopy, etc.
3. Easy viewing of opaque samples, laser alignment, and can be used as a condenser for brightfield or phase contrast illumination on transparent samples
4. Simple, high-resolution imaging in liquid on soft biological samples
5. Force spectroscopy and force mechanics
6. Nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
7. Nanoelectrical and electromechanical characterization modes

Operating Modes:
Contact mode
Tapping mode (AC mode)
Piezoresponse Force Microscopy (PFM)
Dual AC Resonance Tracking (DART)
DART PFM
Electrostatic Force Microscopy (EFM)
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Magnetic Force Microscopy (MFM)
Nanolithography
Phase imaging
Vector PFM
AM-FM Viscoelastic Mapping Mode
Conductive AFM (CAFM) with ORCA™
Scanning Tunneling Microscopy (STM)

Software used:

1. AR SPM 16.24.225
2. Igor Pro 6.38B01